Description: This instrument features “ direct waveform analyze, accurate and stable measurement, new multi-functional interface, easy operation.” Measurement is computer-aided, special network analyzer is self-made (external network analyzer is optional). This instrument can make the measurement of main and sub-waveform and triple frequency. Friendly graphic/text man-machine interface can analyzes the parameters of the chips under test. The measured data can be transferred to the computer for processing. Customer can make graphic statistics of the measured data (sigma, CPK, etc.), store or printing. To-and-fro cam and high accurate guide track ensures the testing head moving stable, accurate and reliable positioning. In terms of measurement mode, accuracy, and reliability, this instrument is advanced.

Technical Specifications
 
Frequency range:  2MHz-60MHz
Dimensions (mm):  Φ2.0-8.5 wafers; bar chips in the range of L：1.0-8.0,W:0.8-                             4.0
Frequency stability： ≤±0.2kHz
Analysis sort：  Main and sub-wave, triple frequency, CPK
Frequency-testing mode: Special network analyzer measurement, high-precision to-                                      and-fro cam    positioning, static state testing frequency
Display mode:    Frequency-amplitude characteristic curve
Output mode：  Data statistics, saving and printing
Operating conditions： Temperature: about 25℃ room temperature;

Relative         humidity: 55％-   75％；

Operating power supply：AC220V±10% 2A